Your search returned 2 results.

Results
	1.		Pattern recognition and artificial intelligence : Towards an integration : proceedings of an International Workshop held in Amsterdam, May 18-20, 1988 / Ed. by Edzard S. Gelsema and Laveen N. Kanal. by Gelsema, Edzard S, 1937- [edt] Kanal, Laveen N [edt] Series: Machine intelligence and pattern recognition ; Vol. 7 Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Amsterdam ; New York : New York, N.Y., USA : North Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Publ. Co., 1988 Availability: Items available for loan: Fundamental Scientific Library (1)Call number: Gulb/6775. Place hold Save to lists Add to cart (remove)
	2.		Uncertainty in artificial intelligence 2 / Ed. by John F. Lemmer and Laveen N. Kanal. by Lemmer, John F [edt] Kanal, Laveen N [edt] Series: Machine intelligence and pattern recognition ; Vol. 5 Material type: Continuing resource; Format: print Language: English Publication details: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Publ., 1986- Availability: Items available for loan: Fundamental Scientific Library (1)Call number: Gulb/6774. Place hold Save to lists Add to cart (remove)

Refine your search