Электронная микроскопия тонких кристаллов : Пер.с англ./ П.Хирш, А. Хови и др.; Под ред. Л.М. Утевского.
Material type:
- Electron microscopy of thin crystals [Added title page title]
Item type | Current library | Collection | Call number | Status | Notes | Barcode | |
---|---|---|---|---|---|---|---|
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Fundamental Scientific Library | General | PIII/27092 (Browse shelf(Opens below)) | Available | 30 Days Loan | FL0488086 |
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