Анализ поверхности методом оже- и рентгеновcкой фотоэлектронной спектроскопии / Под ред. Д. Бриггса и М.П. Сиха ; Пер. с англ. под ред. В.И. Раховского и И.С. Реза.
Material type:
- Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy [Parallel title]
Item type | Current library | Collection | Call number | Status | Notes | Barcode | |
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Fundamental Scientific Library | General | PII/573910 (Browse shelf(Opens below)) | Available | 30 Days Loan | FL0101712 | |
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Fundamental Scientific Library | General | PII/584537 (Browse shelf(Opens below)) | Available | 30 Days Loan | FL0083412 |
Списки лит. в конце гл.
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